Commit eb29af5
David Saada
Fix direct access to device key test for small erase/program ratio
This commit fixes the failure in the "Direct access to device key" test,
when working with internal flash components, whose erase size to program
size ratio is small. In such cases, the last two sectors are not large
enough to store the device key.1 parent 355f09b commit eb29af5
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lines changed- features/storage/TESTS/kvstore/direct_access_devicekey_test
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