-The Peak List data tree entry is used to fit diffraction peaks at refined or user-supplied positions (not generated from a unit cell). Peak positions and intensities may be selected for individual refinement. Gaussian (\(\sigma^2\)) and Lorentzian (\(\Gamma\)) peak widths may be varied individually or the values may be generated from the the appropriate profile terms in the Instrument Parameters tree item (U, V & W for \(\sigma^2\); X & Y for \(\Gamma\)): Note that the Gaussian full-width at half-maximum is given by
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