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Copy file name to clipboardExpand all lines: server/src/gpt-controller.ts
+18-19Lines changed: 18 additions & 19 deletions
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@@ -34,7 +34,7 @@ export class GPTController {
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"Imagine you are a radiation-effects specialist for electronic components. You are well versed in the lingo, and the methodologies for testing devices. Take the paper, parse it, and then return me the data I request in the format I provide. Return in a JSON format and do not include any extra explanations",
Copy file name to clipboardExpand all lines: server/src/refined-prompts.data.ts
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@@ -93,16 +93,18 @@ export const questions = {
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},
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testingConditions: {
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prompt: `Describe the type of radiation testing that was conducted.:
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- Type of testing performed (ONLY ONE OF [ TID, SEE, DD])
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This testing will be either TID SEE(General) OR DD
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You may ONLY return types TID, SEE or DD for this step
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There might be more than one test for the given part, if that is the case return a list of tests pertaining to the part
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There might be more than one test for the given part, return a list of different test types, if two tests of the same type are found create two entries, for one each
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Return the response as a **valid JSON object** with the following structure:
"paper_name": "SEE In-Flight Data for Two Static 32KB Memories on High Earth Orbit",
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"year": 2002,
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"authors": [
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{
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"name": "S. Duzellier"
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},
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{
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"name": "S. Bourdarie"
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},
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{
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"name": "R. Velazco"
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},
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{
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"name": "B. Nicolescu"
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},
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{
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"name": "R. Ecoffet"
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}
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],
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"objective": "The main objective of the paper is to present the detailed analysis of in-flight data obtained from two 32KB SRAMs in the MPTB orbit, focusing on the performance, reliability, and survivability of these devices in the space radiation environment over a four-year period."
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},
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"parts": [
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{
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"device_name": "HM62256",
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"component_type": "SRAM",
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"manufacturer": "Hitachi",
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"other_details": "32KB memory used for SEE detection, entire device operated for SEE detection, tested using Ram Static Test method"
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"other_details": "Entirely tested using Ram Static Test method. Exhibited stuck bits during solar events.",
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"preliminary_test_types": [
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"SEE",
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"TID"
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],
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"seeData": [
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{
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"max_fluence": 0.0000025,
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"energy_levels": "Proton Threshold: 10 MeV, Heavy Ion Threshold: 1.7 MeV/mg.cm²",
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"facility_name": "MPTB orbit",
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"environmental_conditions": "High latitude and altitude, during solar events",
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"terrestrial": false,
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"in_flight": true,
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"source": "Protons",
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"see_type": "SEU",
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"amplitude": 60,
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"duration": 1,
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"cross_section_saturation": 5.4e-13,
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"cross_section_threshold": 1.7,
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"cross_section_type": "cm²/bit",
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"special_notes": "Stuck bits correlated to solar events indicating heavy ions presence"
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}
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],
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"tidData": [
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{
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"max_fluence": 0.0000025,
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"energy_levels": "Proton Threshold: 10 MeV, Heavy Ion Threshold: 1.7 MeV/mg.cm²",
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"facility_name": "MPTB orbit",
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"environmental_conditions": "High latitude and altitude, during solar events",
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"terrestrial": false,
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"in_flight": true,
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"source": "Protons",
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"max_tid": 0.0000048,
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"dose_rate": 0.0000016,
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"eldrs_observed": false,
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"dose_to_failure": 365,
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"increased_power_usage": true,
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"power_usage_description": "Increased during solar events",
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"current_leakage": 0.0001,
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"failing_time": "Few hours to almost a month",
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"special_notes": "Stuck bits correlated to solar events indicating heavy ions presence"
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}
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],
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"ddData": []
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},
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{
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"device_name": "HM65756",
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"component_type": "SRAM",
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"manufacturer": "Matra-MHS",
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"other_details": "32KB memory used for storage of T225 process workspaces and data, partly tested using CRC and RST methods"
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"other_details": "Partly tested using both Cyclic Redundancy Checksum and Ram Static Test methods. Used for storage of T225 process workspaces and data.",
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"preliminary_test_types": [
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"SEE",
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"SEE"
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],
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"seeData": [
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{
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"max_fluence": 0.0000028,
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"energy_levels": "Proton Threshold: 5 MeV, Heavy Ion Threshold: 0.1 MeV/mg.cm²",
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"facility_name": "MPTB orbit",
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"environmental_conditions": "High latitude and altitude, during solar events",
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"terrestrial": false,
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"in_flight": true,
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"source": "Protons",
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"see_type": "SEU",
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"amplitude": 60,
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"duration": 1,
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"cross_section_saturation": 1.2e-12,
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"cross_section_threshold": 0.1,
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"cross_section_type": "cm²/bit",
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"special_notes": "SEU rate increases during solar events, indicating heavy ion presence"
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},
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{
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"max_fluence": 0.0000028,
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"energy_levels": "Proton Threshold: 5 MeV, Heavy Ion Threshold: 0.1 MeV/mg.cm²",
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"facility_name": "MPTB orbit",
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"environmental_conditions": "High latitude and altitude, during solar events",
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"terrestrial": false,
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"in_flight": true,
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"source": "Protons",
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"see_type": "SEU",
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"amplitude": 60,
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"duration": 1,
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"cross_section_saturation": 1.2e-12,
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"cross_section_threshold": 0.1,
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"cross_section_type": "cm²/bit",
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"special_notes": "SEU rate increases during solar events, indicating heavy ion presence"
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}
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],
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"tidData": [],
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"ddData": []
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}
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],
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"part_tests": [
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{
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"device_name": "HM62256",
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"testing_type": "SEE",
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"max_fluence": 10000000,
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"energy_levels": "Proton: 10 MeV, Heavy Ion: 1.7 MeV/mg.cm²",
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"facility_name": "MPTB (Microelectronics and Photonics Test Bed)",
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"environmental_conditions": "High Earth Orbit, solar maximum condition",
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"terrestrial": false,
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"in_flight": true
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},
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{
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"device_name": "HM65756",
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"testing_type": "SEE",
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"max_fluence": 10000000,
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"energy_levels": "Proton: 5 MeV, Heavy Ion: 0.1 MeV/mg.cm²",
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"facility_name": "MPTB (Microelectronics and Photonics Test Bed)",
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"environmental_conditions": "High Earth Orbit, solar maximum condition",
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"terrestrial": false,
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"in_flight": true
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}
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],
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"part_specific": {
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"SEE": [
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{
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"max_fluence": 10000000,
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"energy_levels": "Proton: 10 MeV, Heavy Ion: 1.7 MeV/mg.cm²",
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"facility_name": "MPTB (Microelectronics and Photonics Test Bed)",
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"environmental_conditions": "High Earth Orbit, solar maximum condition",
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"terrestrial": false,
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"in_flight": true,
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"source": "Protons",
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"see_type": "SEU",
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"amplitude": 60,
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"duration": 1,
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"cross_section_saturation": 0.0000025,
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"cross_section_threshold": 1.7,
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"cross_section_type": "cm²/bit",
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"special_notes": "Stuck bits observed during solar events, indicating presence of heavy ions"
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},
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{
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"max_fluence": 10000000,
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"energy_levels": "Proton: 5 MeV, Heavy Ion: 0.1 MeV/mg.cm²",
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"facility_name": "MPTB (Microelectronics and Photonics Test Bed)",
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"environmental_conditions": "High Earth Orbit, solar maximum condition",
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"terrestrial": false,
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"in_flight": true,
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"source": "Protons",
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"see_type": "SEU",
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"amplitude": 47,
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"duration": 1,
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"cross_section_saturation": 0.0000028,
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"cross_section_threshold": 0.1,
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"cross_section_type": "cm²/bit",
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"special_notes": "SEU rate increase observed during solar events, particularly severe during the November 2001 event"
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