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Retraction of NXevent_data_em_set for the reason that just an additional grouping in an appdef can also be achieved by just adding event_data_set(NXobject) and having current NXevent_data_em_set docstring there inside the appdef
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base_classes/NXevent_data_em.nxdl.xml

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bring the microscope into a state where conditions are considered better
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or of whatever high enough quality for continuing the measurement.
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Which temporal granularity is adequate depends on the situation and
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research question. Using a model which enables a collection of events offers
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the most flexible way to cater for both experiments with controlled electron
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beams in a real microscope or the simulation of such experiments or
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individual aspects of such experiments.
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In all these use cases in practice it would be useful to have a mechanism
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whereby time-dependent data of the instrument state can be stored and
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documented with an interoperable representation. Indeed, how a session on an

base_classes/NXevent_data_em_set.nxdl.xml

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