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fix(ci): Update touch test
1 parent 5c2ebf4 commit 41287a3

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+11
-41
lines changed

1 file changed

+11
-41
lines changed

tests/validation/touch/touch.ino

Lines changed: 11 additions & 41 deletions
Original file line numberDiff line numberDiff line change
@@ -43,21 +43,14 @@ uint8_t TOUCH_GPIOS[] = {2, 3, 4, 5, 6 /*, 7, 8, 9, 10, 11, 12 ,13, 14, 15*/};
4343
#define NO_TOUCH_GPIO 17
4444
#endif
4545

46+
#define INTERRUPT_THRESHOLD 0 // Use benchmarked threshold
47+
4648
#if CONFIG_IDF_TARGET_ESP32
47-
#define RELEASED_VALUE 75 //75+ read value to pass test
48-
#define PRESSED_VALUE 20 //20- read value to pass test
49-
#define INTERRUPT_THRESHOLD 40
50-
#elif CONFIG_IDF_TARGET_ESP32S2
51-
#define RELEASED_VALUE 10000 //10000- read value to pass test
52-
#define PRESSED_VALUE 42000 //40000+ read value to pass test
53-
#define INTERRUPT_THRESHOLD 30000
54-
#elif CONFIG_IDF_TARGET_ESP32S3
55-
#define RELEASED_VALUE 25000 //25000- read value to pass test
56-
#define PRESSED_VALUE 90000 //90000+ read value to pass test
57-
#define INTERRUPT_THRESHOLD 80000
58-
#elif CONFIG_IDF_TARGET_ESP32P4
49+
#define PRESSED_VALUE_DIFFERENCE 200 //-200 read value difference against the unpressed value
50+
#elif CONFIG_IDF_TARGET_ESP32S3 || CONFIG_IDF_TARGET_ESP32S2
51+
#define PRESSED_VALUE_DIFFERENCE 2000 //2000+ read value difference against the unpressed value
52+
#elif CONFIG_IDF_TARGET_ESP32P4 || CONFIG_IDF_TARGET_ESP32S2 || CONFIG_IDF_TARGET_ESP32S3
5953
#define PRESSED_VALUE_DIFFERENCE 200 //200+ read value difference against the unpressed value
60-
#define INTERRUPT_THRESHOLD 0 // Use benchmarked threshold
6154
#else
6255
#error Test not currently supported on this chip. Please adjust and try again!
6356
#endif
@@ -109,31 +102,6 @@ void tearDown(void) {
109102
* Test Touch read on all available channels - compare values if reading is right
110103
*/
111104
void test_touch_read(void) {
112-
113-
#if SOC_TOUCH_SENSOR_VERSION <= 2
114-
//TEST RELEASE STATE
115-
for (int i = 0; i < sizeof(TOUCH_GPIOS); i++) {
116-
#ifdef CONFIG_IDF_TARGET_ESP32
117-
TEST_ASSERT_GREATER_THAN(RELEASED_VALUE, touchRead(TOUCH_GPIOS[i]));
118-
#else
119-
TEST_ASSERT_LESS_THAN(RELEASED_VALUE, touchRead(TOUCH_GPIOS[i]));
120-
#endif
121-
}
122-
123-
// TEST PRESS STATE
124-
for (int j = 0; j < TEST_TOUCH_CHANNEL; j++) {
125-
test_press_fake(touch_list[j]);
126-
}
127-
delay(100);
128-
129-
for (int k = 0; k < sizeof(TOUCH_GPIOS); k++) {
130-
#ifdef CONFIG_IDF_TARGET_ESP32
131-
TEST_ASSERT_LESS_THAN(PRESSED_VALUE, touchRead(TOUCH_GPIOS[k]));
132-
#else
133-
TEST_ASSERT_GREATER_THAN(PRESSED_VALUE, touchRead(TOUCH_GPIOS[k]));
134-
#endif
135-
}
136-
#else //TOUCH V3
137105
//TEST RELEASE STATE
138106
touch_value_t touch_unpressed[sizeof(TOUCH_GPIOS)];
139107
for (int i = 0; i < sizeof(TOUCH_GPIOS); i++) {
@@ -151,11 +119,14 @@ void test_touch_read(void) {
151119
touch_pressed[k] = touchRead(TOUCH_GPIOS[k]);
152120
}
153121

154-
// COMPARE PRESSED > UNPRESSED
122+
// COMPARE PRESSED <-> UNPRESSED
155123
for (int l = 0; l < sizeof(TOUCH_GPIOS); l++) {
124+
#if CONFIG_IDF_TARGET_ESP32
125+
TEST_ASSERT_LESS_THAN((touch_unpressed[l] - PRESSED_VALUE_DIFFERENCE), touch_pressed[l]);
126+
#else
156127
TEST_ASSERT_GREATER_THAN((touch_unpressed[l] + PRESSED_VALUE_DIFFERENCE), touch_pressed[l]);
157-
}
158128
#endif
129+
}
159130
}
160131

161132
void test_touch_interrtupt(void) {
@@ -166,7 +137,6 @@ void test_touch_interrtupt(void) {
166137
test_press_fake(touch_list[0]);
167138
test_press_fake(touch_list[1]);
168139

169-
delay(300);
170140

171141
touchDetachInterrupt(TOUCH_GPIOS[0]);
172142
touchDetachInterrupt(TOUCH_GPIOS[1]);

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