Merge branch 'ci/tee_flash_prot_failures' into 'master'

ci(esp_tee): Remove incorrect error checks for TEE flash protection tests

Closes IDFCI-3299, IDFCI-4947, IDFCI-4092, IDFCI-4093, and IDF-14283

See merge request espressif/esp-idf!43140

Author: laukik-hase

components/esp_tee/subproject/components/tee_sec_storage/tee_sec_storage.c

@@ -643,11 +643,12 @@ esp_err_t esp_tee_sec_storage_ecdsa_sign_pbkdf2(const esp_tee_sec_storage_pbkdf2
         return ESP_ERR_INVALID_ARG;
     }
 
-    hmac_key_id_t key_id = (hmac_key_id_t)(CONFIG_SECURE_TEE_PBKDF2_EFUSE_HMAC_KEY_ID);
-    if (key_id < 0 || key_id >= HMAC_KEY_MAX) {
+    int cfg_key_id = (int)CONFIG_SECURE_TEE_PBKDF2_EFUSE_HMAC_KEY_ID;
+    if (cfg_key_id < 0 || cfg_key_id >= HMAC_KEY_MAX) {
         return ESP_ERR_INVALID_ARG;
     }
 
+    hmac_key_id_t key_id = (hmac_key_id_t)cfg_key_id;
     esp_efuse_block_t blk = (esp_efuse_block_t)(EFUSE_BLK_KEY0 + key_id);
     if (esp_efuse_get_key_purpose(blk) != ESP_EFUSE_KEY_PURPOSE_HMAC_UP) {
         ESP_LOGE(TAG, "HMAC key is not burnt in the specified eFuse block ID");

components/esp_tee/test_apps/tee_test_fw/main/test_esp_tee_flash_prot.c

@@ -49,12 +49,6 @@ __attribute__((unused)) static const uint32_t mmu_op_fail_seq[8] = {[0 ... 7] =
     } while (0)
 #endif
 
-#if SOC_TEE_FLASH_OP_FAIL_FAULT
-#define CHECK_FLASH_OP_FAIL(err) TEST_ESP_ERR(ESP_FAIL, err)
-#else
-#define CHECK_FLASH_OP_FAIL(err) do { (void)(err); esp_restart(); } while (0)
-#endif
-
 static const char *TAG = "test_esp_tee_flash_prot";
 
 static void set_boot_count_in_nvs(uint8_t boot_count)
@@ -147,24 +141,21 @@ static void test_esp_partition_api_r(const esp_partition_t *part)
     TEST_ASSERT_NOT_NULL(part);
     uint8_t buf_r[128];
     memset(buf_r, 0x00, sizeof(buf_r));
-    esp_err_t err = esp_partition_read(part, 0x00, buf_r, sizeof(buf_r));
-    CHECK_FLASH_OP_FAIL(err);
+    esp_partition_read(part, 0x00, buf_r, sizeof(buf_r));
 }
 
 static void test_esp_partition_api_w(const esp_partition_t *part)
 {
     TEST_ASSERT_NOT_NULL(part);
     uint8_t buf_w[128];
     memset(buf_w, 0xA5, sizeof(buf_w));
-    esp_err_t err = esp_partition_write(part, 0x00, buf_w, sizeof(buf_w));
-    CHECK_FLASH_OP_FAIL(err);
+    esp_partition_write(part, 0x00, buf_w, sizeof(buf_w));
 }
 
 static void test_esp_partition_api_e(const esp_partition_t *part)
 {
     TEST_ASSERT_NOT_NULL(part);
-    esp_err_t err = esp_partition_erase_range(part, 0x00, SPI_FLASH_SEC_SIZE);
-    CHECK_FLASH_OP_FAIL(err);
+    esp_partition_erase_range(part, 0x00, SPI_FLASH_SEC_SIZE);
 }
 
 static void test_esp_partition_api(void)
@@ -269,22 +260,19 @@ static void test_esp_flash_api_r(uint32_t paddr)
 {
     uint8_t buf_r[128];
     memset(buf_r, 0x00, sizeof(buf_r));
-    esp_err_t err = esp_flash_read(NULL, buf_r, paddr, sizeof(buf_r));
-    CHECK_FLASH_OP_FAIL(err);
+    esp_flash_read(NULL, buf_r, paddr, sizeof(buf_r));
 }
 
 static void test_esp_flash_api_w(uint32_t paddr)
 {
     uint8_t buf_w[128];
     memset(buf_w, 0xA5, sizeof(buf_w));
-    esp_err_t err = esp_flash_write(NULL, buf_w, paddr, sizeof(buf_w));
-    CHECK_FLASH_OP_FAIL(err);
+    esp_flash_write(NULL, buf_w, paddr, sizeof(buf_w));
 }
 
 static void test_esp_flash_api_e(uint32_t paddr)
 {
-    esp_err_t err = esp_flash_erase_region(NULL, paddr, SPI_FLASH_SEC_SIZE);
-    CHECK_FLASH_OP_FAIL(err);
+    esp_flash_erase_region(NULL, paddr, SPI_FLASH_SEC_SIZE);
 }
 
 static void test_esp_flash_api(void)