Hi @shubhamdp , @Jerry-ESP ,
ESP-Matter Commit id: 1560327
ESD-IDF version: v5.4.1
SoC: ESP32-S3
MTH Version: v2.13+summer2025
We are facing issues while running semi-automated test cases (example: TC-BINFO-2.1) using the Test Harness (TH).
The issue occurs when the DUT is recommissioned using chip-tool after a factory reset. After this, the Test Harness is unable to read attributes from the DUT.
We followed the steps mentioned in the TH User Guide, but the test case fails during execution.
Commissioning with chip-tool succeeds.
DUT appears operational.
When TH attempts to read attributes, it fails.
Test case does not proceed further.