tests: Bluetooth: bsim: Handle consecutive connection in tests

If we want to test conn on legacy and ext adv, we need scanx to
handle connection more than once. Change local flag to global and
let it indicate whether we want scanx to initaite connection when
device is scanned.

Signed-off-by: Andrzej Kaczmarek <[email protected]>

Author: andrzej-kaczmarek

tests/bluetooth/bsim_bt/bsim_test_advx/src/main.c

@@ -94,6 +94,7 @@ static uint8_t per_adv_data2[] = {
 	};
 
 static bool volatile is_connected, is_disconnected;
+static bool volatile connection_to_test;
 
 static void connected(struct bt_conn *conn, uint8_t conn_err)
 {
@@ -735,13 +736,12 @@ static void scan_cb(const bt_addr_le_t *addr, int8_t rssi, uint8_t adv_type,
 {
 	printk("%s: type = 0x%x.\n", __func__, adv_type);
 
-	static bool connection_tested;
 	struct bt_conn *conn;
 
-	if (!connection_tested) {
+	if (connection_to_test) {
 		int err;
 
-		connection_tested = true;
+		connection_to_test = false;
 
 		err = bt_le_scan_stop();
 		if (err) {
@@ -942,6 +942,8 @@ static void test_scanx_main(void)
 	bt_le_per_adv_sync_cb_register(&sync_cb);
 	printk("Success.\n");
 
+	connection_to_test = true;
+
 	printk("Start scanning...");
 	err = bt_le_scan_start(&scan_param, scan_cb);
 	if (err) {