negative tests. Multiple usage

Signed-off-by: Alexander Peskov <[email protected]>

Author: apeskov

llvm/lib/CodeGen/SelectionDAG/DAGCombiner.cpp

@@ -10975,7 +10975,7 @@ SDValue DAGCombiner::visitSRL(SDNode *N) {
   // fold (srl (logic_op x, (shl (zext y), c1)), c1)
   //   -> (logic_op (srl x, c1), (zext y))
   // c1 <= leadingzeros(zext(y))
-  if (N1C && ISD::isBitwiseLogicOp(N0.getOpcode())) {
+  if (N1C && ISD::isBitwiseLogicOp(N0.getOpcode()) && N0.hasOneUse()) {
     SDValue lhs = N0.getOperand(0);
     SDValue rhs = N0.getOperand(1);
     SDValue shl;
@@ -10987,7 +10987,7 @@ SDValue DAGCombiner::visitSRL(SDNode *N) {
       shl = rhs;
       other = lhs;
     }
-    if (shl && shl.getOperand(1) == N1) {
+    if (shl && shl.getOperand(1) == N1 && shl.hasOneUse()) {
       SDValue zext = shl.getOperand(0);
       if (zext.getOpcode() == ISD::ZERO_EXTEND) {
         unsigned numLeadingZeros =

llvm/test/CodeGen/NVPTX/shift-opt.ll

@@ -107,15 +107,17 @@ define i64 @test_negative_use_lop(i64 %x, i32 %y) {
 ;
 ; srl (or (x, shl(zext(y),c1)),c1) -> or(srl(x,c1), zext(y))
 ; c1 <= leadingzeros(zext(y))
-;  
-; 
+; multiple usage of "or"
 ;
 ; CHECK-LABEL: test_negative_use_lop
-; CHECK: ld.param.u64 %[[X:rd[0-9]+]], [test_negative_c_param_0];
-; CHECK: ld.param.u32 %[[Y:rd[0-9]+]], [test_negative_c_param_1];
-; CHECK: shl.b64      %[[SHL:rd[0-9]+]], %[[Y]], 33;
+; CHECK: ld.param.u64 %[[X:rd[0-9]+]], [test_negative_use_lop_param_0];
+; CHECK: ld.param.u32 %[[Y:r[0-9]+]], [test_negative_use_lop_param_1];
+; CHECK: mul.wide.u32 %[[SHL:rd[0-9]+]], %[[Y]], 32;
 ; CHECK: or.b64       %[[OR:rd[0-9]+]], %[[X]], %[[SHL]];
-; CHECK: shr.u64      %[[SHR:rd[0-9]+]], %[[OR]], 33;
+; CHECK: shr.u64      %[[SHR:rd[0-9]+]], %[[OR]], 5;
+; CHECK: { // callseq
+; CHECK:      st.param.b64    [param0], %[[OR]];
+; CHECK: } // callseq
 ; CHECK: st.param.b64 [func_retval0], %[[SHR]];
 ;
   %ext = zext i32 %y to i64
@@ -124,4 +126,30 @@ define i64 @test_negative_use_lop(i64 %x, i32 %y) {
   %srl = lshr i64 %or, 5
   call void @use(i64 %or)
   ret i64 %srl
-}
+}
+
+
+define i64 @test_negative_use_shl(i64 %x, i32 %y) {
+;
+; srl (or (x, shl(zext(y),c1)),c1) -> or(srl(x,c1), zext(y))
+; c1 <= leadingzeros(zext(y))
+; multiple usage of "shl"
+;
+; CHECK-LABEL: test_negative_use_shl
+; CHECK: ld.param.u64 %[[X:rd[0-9]+]], [test_negative_use_shl_param_0];
+; CHECK: ld.param.u32 %[[Y:r[0-9]+]], [test_negative_use_shl_param_1];
+; CHECK: mul.wide.u32 %[[SHL:rd[0-9]+]], %[[Y]], 32;
+; CHECK: or.b64       %[[OR:rd[0-9]+]], %[[X]], %[[SHL]];
+; CHECK: shr.u64      %[[SHR:rd[0-9]+]], %[[OR]], 5;
+; CHECK: { // callseq
+; CHECK:      st.param.b64    [param0], %[[SHL]];
+; CHECK: } // callseq
+; CHECK: st.param.b64 [func_retval0], %[[SHR]];
+;
+  %ext = zext i32 %y to i64
+  %shl = shl i64 %ext, 5
+  %or = or i64 %x, %shl
+  %srl = lshr i64 %or, 5
+  call void @use(i64 %shl)
+  ret i64 %srl
+}