functional test DTM RX channel changed

Author: limpkin

source_code/aux_mcu/src/COMMS/comms_main_mcu.c

@@ -586,7 +586,7 @@ void comms_main_mcu_deal_with_non_usb_non_ble_message(aux_mcu_message_t* message
                 }
 
                 /* Then set the device in DTM RX mode on channel 0 */
-                debug_dtm_rx(0);
+                debug_dtm_rx(39);
 
                 /* Set the high current sense pin as its original purpose */
                 platform_io_set_high_cur_sense_as_sense();

source_code/main_mcu/src/functional_testing.c

@@ -310,7 +310,7 @@ void functional_testing_start(BOOL clear_first_boot_flag)
     #endif
 
     /* Check for received messages */
-    if (temp_rx_message->aux_mcu_event_message.payload_as_uint16[0] < 50)
+    if (temp_rx_message->aux_mcu_event_message.payload_as_uint16[0] < 1400)
     {
         sh1122_put_error_string(&plat_oled_descriptor, u"ATBTLC1000 error / NO RX!");
         while (platform_io_is_usb_3v3_present_raw() != FALSE);