- Compute Capability: Minimum 10 TOPS (INT8)
- Matrix Multiplication: 1024×1024 completion in <5ms
- Memory Bandwidth: 25 GB/s for weight access
- Batch Processing: Support for 1-16 batch size
- Model Size Support: Up to 50MB parameter storage
- Inference Latency: <10ms for standard models
- Error Detection Time: <1μs from fault to detection
- Error Correction Time: <10μs from detection to correction
- Scrubbing Overhead: <5% performance impact during memory scrubbing
- Total Power Consumption: Maximum 12W at peak operation
- Power States: 5 discrete states from 0.2x to 1.0x of peak
- Idle Power: <100mW in sleep state
- Power Efficiency: >1 TOPS/W in nominal operating mode
- SEU Tolerance: <1E-10 errors/bit-day in LEO
- SEU Tolerance: <1E-8 errors/bit-day in Jupiter environment
- SET Immunity: No operational impact from transients <500ps
- SEL Immunity: No latch-up for LET <100 MeV-cm²/mg
- SEFI Tolerance: Automatic recovery from functional interrupts
- SEGR Immunity: Gate rupture immunity for all operating conditions
- TID Tolerance: Maintain full operation to 100 krad(Si)
- Extended Operation: Degraded but functional to 300 krad(Si)
- Annealing Recovery: Support for voltage/temperature annealing recovery
- Neutron Tolerance: Functional after 1E13 n/cm²
- Proton Tolerance: Functional after 1E11 p/cm² (50-200 MeV)
- Operational Range: -55°C to +125°C
- Survival Range: -65°C to +150°C
- Quantum Enhancement: Optimized for <150K operation
- Thermal Cycling: 1000 cycles from -55°C to +125°C with no degradation
- Outgassing: Compliant with NASA outgassing standards
- Vacuum Performance: No degradation in high vacuum (10^-6 torr)
- Thermal Management: Conduction-based cooling design
- Vibration Tolerance: 14.1 Grms random vibration
- Shock Tolerance: 2000g, 0.5ms shock pulses
- Board Mounting: Standard 1.27mm pitch BGA or CGA
- TMR Modes: Three configurable levels (SELECTIVE, REGISTER, COMPLETE)
- Voting Algorithm: Support for standard, weighted, and pattern-recognition voting
- Error Reporting: Detailed error logs for detected and corrected errors
- Error Rate Calculation: Running statistics on error rates per component
- Topology Support: Fully-connected, convolutional, and residual networks
- Width Configurability: Adjustable from 32 to 256 nodes per layer
- Dropout Implementation: Hardware random dropout from 0.3 to 0.7
- Activation Functions: ReLU, tanh, sigmoid, with TMR protection
- ECC Protection: Reed-Solomon ECC on all memories
- Memory Scrubbing: Configurable intervals from 1-60 seconds
- Protected Values: Hardware implementation of multi-copy with CRC
- Address Space Protection: Memory isolation for critical data
- Radiation Monitoring: Built-in radiation sensors
- Environment Detection: Automatic mission environment classification
- Protection Adaptation: Dynamic adjustment based on detected conditions
- Power/Protection Balance: Optimal resource allocation between protection and performance
- System Bus: AXI4 or equivalent high-performance bus
- External Memory: DDR4 with ECC, triple redundant control signals
- Host Interface: PCIe Gen4 x4 or SpaceWire
- Debug Interface: JTAG with secure access control
- Configuration Registers: Memory-mapped at base address 0x4000_0000
- Status Registers: Read-only status at base address 0x4000_1000
- Error Registers: Error reporting at base address 0x4000_2000
- Protection Level: Dynamic protection control registers
- Driver Model: Compatible with existing framework API
- Configuration Interface: JSON-based configuration
- Telemetry Interface: Standard space telemetry format
- Firmware Update: Secure, validated update mechanism
- Package Type: CCGA or equivalent space-grade package
- Size Constraint: Maximum die size 15mm × 15mm
- Pin Count: 484-1024 pins depending on configuration
- Weight Limit: <50g for packaged device
- Preferred Node: 28nm FD-SOI or equivalent
- Alternative: 22nm FD-SOI for advanced performance
- Feature Size Sensitivity: <20nm for quantum protection benefits
- Manufacturing Standards: QML-V or equivalent certification
- Supply Voltages: 0.9V core, 1.8V I/O, 1.2V memory
- Power Sequencing: Defined safe startup and shutdown sequence
- Current Requirements: <10A total at maximum operation
- Protection Circuits: Overvoltage, undervoltage, overcurrent protection
- SEE Testing: Heavy ion testing to LET >100 MeV-cm²/mg
- TID Testing: Gamma irradiation to 300 krad(Si)
- Proton Testing: 50-200 MeV protons to 1E11 p/cm²
- Testing Standards: ASTM F1192, MIL-STD-883 Method 1019
- Temperature Cycling: MIL-STD-883 Method 1010
- Thermal Vacuum: NASA GSFC-STD-7000A
- Vibration: MIL-STD-883 Method 2026
- Mechanical Shock: MIL-STD-883 Method 2002
- Lifetime Validation: 2000 hours at 125°C
- Accelerated Aging: 168 hours at 150°C
- MTBF Requirement: >1 million hours
- Failure Rate: <100 FITs (Failures In Time)
- NASA Standards: GSFC-STD-7000A, EEE-INST-002
- ESA Standards: ECSS-Q-ST-60C
- Radiation Testing: ASTM F1192, JESD89A
- Quality Assurance: AS9100, MIL-PRF-38535
- Design Methodology: DO-254 or equivalent
- Verification: MIL-STD-883 Method 5004
- Documentation: MIL-STD-498 or equivalent
- Risk Management: NPR 8000.4
- Testbenches: 100% functional coverage
- Formal Verification: Critical blocks formally verified
- Fault Injection: Comprehensive SEU injection testing
- Mission Profiles: Verification against all mission scenarios
- Benchmark Suite: Standard ML benchmarks (ResNet-50, MobileNet, etc.)
- Power Measurement: Calibrated power measurement at all states
- Thermal Validation: Temperature profiling under load
- Radiation Performance: Performance verification under radiation
- Hardware-in-the-Loop: Testing with flight software
- System Integration: Full spacecraft bus integration testing
- Interface Validation: All interfaces verified at margin conditions
- Edge Cases: Boundary condition testing for all parameters
- Architecture Specification: Complete block-level architecture
- Interface Control Document: All external interfaces
- Theory of Operation: Detailed operational description
- Design Rationale: Justification for design decisions
- Integration Guide: Hardware integration instructions
- Programmer's Guide: Register-level programming information
- Application Notes: Common use cases and examples
- Debug Guide: Troubleshooting and diagnostic procedures
- Test Plans: Comprehensive test methodology
- Test Reports: Results from all verification activities
- Radiation Test Reports: Detailed radiation testing results
- Certification Documentation: Compliance certification
- Engineering Samples: Minimum 10 units
- Qualification Units: Minimum 5 units
- Flight Units: As specified in purchase order
- Development Boards: FPGA-based development platform
- Device Drivers: Linux and RTOS compatible drivers
- Test Software: Diagnostic and validation software
- Reference Implementations: Example applications
- Simulation Models: SystemC or equivalent models
- Design Documents: Complete architecture and design documentation
- User Manuals: Integration and operation manuals
- Test Reports: Verification and validation reports
- Quality Records: Manufacturing and inspection records