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radolinDaanDeMeyer
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sd-event: increase test-event timeout to 120s
The test-event test seems to be taking quite a bit more time than the other 'simple tests', which usually complete in < 1s. In case of a slower or loaded machine the default 30s timeout is not enough.
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src/libsystemd/meson.build

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Original file line numberDiff line numberDiff line change
@@ -158,6 +158,10 @@ libsystemd_tests += [
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'sources' : files('sd-journal/test-journal-enum.c'),
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'timeout' : 360,
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},
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{
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'sources' : files('sd-event/test-event.c'),
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'timeout' : 120,
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}
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]
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############################################################
@@ -170,7 +174,6 @@ simple_tests += files(
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'sd-device/test-device-util.c',
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'sd-device/test-sd-device-monitor.c',
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'sd-device/test-sd-device.c',
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'sd-event/test-event.c',
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'sd-journal/test-journal-flush.c',
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'sd-journal/test-journal-interleaving.c',
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'sd-journal/test-journal-stream.c',

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