tools/testing/cxl: Make event logs dynamic

The event logs test was created as static arrays as an easy way to mock
events.  Dynamic Capacity Device (DCD) test support requires events be
generated dynamically when extents are created or destroyed.

The current event log test has specific checks for the number of events
seen including log overflow.

Modify mock event logs to be dynamically allocated.  Adjust array size
and mock event entry data to match the output expected by the existing
event test.

Use the static event data to create the dynamic events in the new logs
without inventing complex event injection for the previous tests.

Simplify log processing by using the event log array index as the
handle.  Add a lock to manage concurrency required when user space is
allowed to control DCD extents

Reviewed-by: Jonathan Cameron <[email protected]>
Reviewed-by: Dave Jiang <[email protected]>
Signed-off-by: Ira Weiny <[email protected]>

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Changes:
[iweiny: rebase to 6.15-rc1]

Author: weiny2