Implement AngleMappingReducer to support Psi scanning on reflectometers with linear detectors (OFFSPEC, POLREF)
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Tom-Willemsen
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Tom-Willemsen
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AngleMappingReducer to support Psi scanning on reflectometers with linear detectors (OFFSPEC, POLREF)
rerpha
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Dec 4, 2025
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These scans worked on OFFSPEC, but needed pretty comparable count times to a 'traditional' one-pixel scan. Scientists are currently thinking of ways to improve this (and taking data to help inform it) |
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Description of work
Adds infrastructure for angle-mapping within a DAE reducer.
This is useful for reflectometry Psi scans on instruments with linear detectors (POLREF, OFFSPEC), which are interested in minimising the fitted witch of a beam profile on their detector (by scanning over Psi, which affects the beam profile).
See documentation in this PR for details.
Ticket
#286
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Documentation
Documentation & diagrams inside PR