apps/examples/rtc, os/arch/arm/src/armino, os/include/tinyara: Add RTC millisecond test functionality for BK7239N#7163
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abhinav-s235 wants to merge 2 commits intoSamsung:masterfrom
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apps/examples/rtc, os/arch/arm/src/armino, os/include/tinyara: Add RTC millisecond test functionality for BK7239N#7163abhinav-s235 wants to merge 2 commits intoSamsung:masterfrom
abhinav-s235 wants to merge 2 commits intoSamsung:masterfrom
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- Added aon_rtc_get_ms() adapter function in armino_rtc.c - Added declaration in armino_rtc.h - Implemented RTC_GET_MS ioctl command support in RTC lower half driver - Added RTC_GET_MS ioctl command definition in rtc.h
…TC test app Added a new "get_ms" command to the RTC example application that allows testing of the aon_rtc_get_ms interface on BK7239N chips. The test function supports configurable test count and delay between tests, and displays RTC time in milliseconds with time difference information.
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We will re-design these changes for adding support of msec api for beken.
- as new ioctl in driver
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This commit adds a new "get_ms" command to the RTC example application for testing the aon_rtc_get_ms interface on BK7239N chips. It implements the RTC_GET_MS ioctl command in the RTC driver and provides a test function that can perform multiple readings with configurable delays.