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VSD Hardware Design Program - NGSPICE for WEEK4


⚙️ CMOS Inverter Characterization and SPICE Simulation Summary

This repository documents a detailed exploration of CMOS inverter behavior using Sky130 PDK, covering both device-level and circuit-level simulations.
Each section (Part 1–6) investigates a key design aspect, from MOSFET characteristics to robustness under variations, with SPICE decks, observations, and analytical insights.


📘 Table of Contents

  1. Part 1: MOSFET Behavior & Id–Vds Characteristics
  2. Part 2: Threshold Voltage Extraction & Velocity Saturation
  3. Part 3: CMOS Inverter: Voltage Transfer Characteristic (VTC)
  4. Part 4: Transient Behavior: Rise–Fall Delays
  5. Part 5: Noise Margin & Robustness Analysis
  6. Part 6: Power-Supply and Device Variation Studies

🧩 Part 1: MOSFET Behavior & Id vs. Vds Characteristics

Objective:
To simulate and understand the I–V characteristics of NMOS and PMOS devices under various gate voltages using Sky130 models.

Key Aspects:

  • Observe linear, saturation, and cutoff regions.
  • Verify channel modulation behavior.
  • Extract transconductance (gm) and output resistance (ro).
  • Validate simulation with theoretical Shockley equations.

Learning Outcome:
Established a clear foundation on MOSFET operation and its regions — essential for CMOS circuit understanding.

🔗 Reference: Part 1: MOSFET Behavior


⚡ Part 2: Threshold Voltage Extraction & Velocity Saturation

Objective:
To determine threshold voltage (Vth) and analyze velocity saturation effects for short-channel MOSFETs.

Key Aspects:

  • Extract Vth from Id–Vgs transfer curve.
  • Analyze subthreshold slope and body effect.
  • Observe mobility degradation at higher fields.
  • Compare long vs. short channel behavior.

Learning Outcome:
Understood that Vth shifts with channel length and body bias, and that velocity saturation limits drive current at nanoscale dimensions.

🔗 Reference: Part 2: Threshold Voltage


🧠 Part 3: CMOS Inverter — Voltage Transfer Characteristic (VTC)

Objective:
To build a CMOS inverter and analyze its Voltage Transfer Characteristics (VTC).

Key Aspects:

  • Use Sky130_fd_pr__pfet_01v8 and nfet_01v8 models.
  • Sweep input voltage (Vin) from 0 → 1.8 V.
  • Plot Vout vs. Vin to identify switching threshold (Vm).
  • Vm observed ≈ 0.87 V — where Vin = Vout.

Learning Outcome:
Demonstrated how W/L ratios influence switching threshold and how the inverter achieves rail-to-rail logic levels.

🔗 Reference: Part 3: CMOS Inverter VTC (link)


⏱️ Part 4: Transient Behavior — Rise & Fall Delays

Objective:
To perform transient analysis of the CMOS inverter by applying a pulse input and measuring rise/fall times.

Key Aspects:

  • Input pulse: 0 → 1.8 V, period = 4 ns.
  • Measure output delay at 50% VDD.
  • Rise time ≈ 0.33 ns, Fall time ≈ 0.285 ns.
  • Delay asymmetry due to mobility differences between PMOS and NMOS.

Learning Outcome:
Established understanding of propagation delay, asymmetric switching, and impact of load capacitance on speed.

🔗 Reference: Part 4: Transient Analysis


📉 Part 5: Noise Margin & Robustness Analysis

Objective:
To calculate Noise Margins (NML & NMH) and examine robustness under process and sizing variations.

Key Aspects:

  • Extract ViH, ViL, VoH, VoL from the VTC curve.
  • Compute:
    • NML = ViL – VoL
    • NMH = VoH – ViH
  • Observe undefined region and identify glitch tolerance.
  • Analyze impact of Wp/Wn ratio on stability.

Learning Outcome:
Demonstrated that CMOS inverters maintain stable logic levels despite variations, proving robustness across conditions.

🔗 Reference: Part 5: Noise Margin


🔋 Part 6: Power-Supply and Device Variation Studies

Objective:
To evaluate inverter performance under supply voltage and device parameter variations.

Key Aspects:

  • Sweep VDD from 5 V → 2.5 V → 1.8 V.
  • Observe corresponding Vm, gain, and energy-delay changes.
  • Validate that dynamic power (P ∝ V²f) decreases drastically with lower VDD.
  • Examine device strength mismatch (Strong NMOS vs. Weak PMOS).

Learning Outcome:
Confirmed that CMOS inverters are scalable and energy-efficient, and that switching threshold shifts minimally with device variation.

🔗 Reference: Part 6: Power & Variation


🧾 Summary

Part Focus Key Takeaway
1 MOSFET I–V Characteristics Foundation for understanding current flow and device operation
2 Threshold & Velocity Saturation Short-channel and high-field effects awareness
3 CMOS Inverter VTC Relationship between input and output logic levels
4 Transient Behavior Rise/fall delay measurement and propagation timing
5 Noise Margin Robustness and logic stability assessment
6 Power & Variation Power optimization and tolerance verification

📚 References


💡 Tip: Each part is self-contained — you can navigate directly using the reference links above and replace them with your actual GitHub or documentation URLs later.

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