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Update 16-bit exp tests to use smaller values (#312)
The `exp` function computes `e^x`, and has wider precision drift for
higher values of `x` due to compounding floating point rounding errors.
For FP32, values under 100 tend to be pretty reliable, but for FP16 you
really need values under 10 to have reliable precision.
This updates the tests to use 2 as the test value instead of 10, making
the test reliable across our test suite.
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