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uefi: Fix lifetimes in device_path TryFrom<&[u8]> impls #5102

uefi: Fix lifetimes in device_path TryFrom<&[u8]> impls

uefi: Fix lifetimes in device_path TryFrom<&[u8]> impls #5102

Triggered via pull request August 1, 2024 19:30
Status Success
Total duration 3m 44s
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rust.yml

on: pull_request
Integration Test (AArch64)
1m 24s
Integration Test (AArch64)
Integration Test (x86_64)
1m 30s
Integration Test (x86_64)
Integration Test (IA-32)
1m 22s
Integration Test (IA-32)
Integration Test (x86_64 Windows)
3m 22s
Integration Test (x86_64 Windows)
Unit + Doc Tests
1m 38s
Unit + Doc Tests
Lints
1m 18s
Lints
Build (stable MSRV)
26s
Build (stable MSRV)
Build (feature permutations)
2m 4s
Build (feature permutations)
Nightly (build, test, doc)
2m 20s
Nightly (build, test, doc)
Unit + Doc Tests (Miri)
1m 9s
Unit + Doc Tests (Miri)
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