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@pdgilbert Test this yet one time.

@burrbull burrbull marked this pull request as ready for review December 15, 2024 06:31
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Ok. I updated to new rmp-new commit:

Updating stm32f1xx-hal v0.10.0 (https://github.com/stm32-rs/stm32f1xx-hal?branch=rmp-new#04b84469) -> #d9f7eab0

and re-ran my example test with success. I also ran a much larger set of example tests with 60 of 80 passing. That is pretty good, since I am still cleaning up many of the tests in the switch to eh-1. (It is up from 5 of 80 a few days ago.) The CI for these is at https://github.com/pdgilbert/rust-integration-testing/actions. The overall coverage of my examples may not be very good, but I think it is pretty good for I2C. (So I give an approving review.) I will do some hardware run testing soon.

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I've tested I2C changes on several examples and they work well.

@burrbull burrbull merged commit 5fc8b99 into master Dec 15, 2024
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@burrbull burrbull deleted the rmp-new branch June 9, 2025 13:08
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2 participants