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Reduce flash wear in flash map tests #81091
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Reduce flash wear in flash map tests #81091
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Found one more erase to remove. |
tomi-font
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Commit nit: needles => needless
Remove needless writes/read and erase in flash_area_get_sectors test scenario, by replacing it with comparison with layout directly obtained from device. Signed-off-by: Dominik Ermel <[email protected]>
The commit moves SHA calculation to separate test scenario, so that it can be run separately from other flash map tests. This reduces flash wear by not running basic flash map tests each time different SHA backend is tested. Signed-off-by: Dominik Ermel <[email protected]>
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Fixed. I am so happy that this has not removed acks. |
👍 As long as the diff remains the same or it's just a rebase without conflict the acks are not discarded. |
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Hi @de-nordic Just tried it on real HW. It is cause by: As CONFIG_FLASH_AREA_CHECK_INTEGRITY_PSA or CONFIG_FLASH_AREA_CHECK_INTEGRITY_MBEDTLS are set to Y, the cmake always takes main_sha.c which only runs one "test test_flash_area_check_int_sha256" test. Log for Before: |
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Hello @butok I have intended to separately run SHA from other test to not wear down devices, where only sha is supposed to be tested, with unneeded write/erase operations. If that is somehow broken please report. |
OK. But there is no a test configuration in testcase.yaml to run the main.c tests. |
The default one does not run anymore? |
The default behavior has been described. Otherwise I wouldn't have added the comment ;) |
I will take a look, but I am quite sure that I have 3 scenarios running each time a test the dir, which includes the base one and two separate sha tests. |
CONFIG_FLASH_AREA_CHECK_INTEGRITY_MBEDTLS is Y for the default case, for me. |
You are right, the fix is here: #81642 |
Two commits: