[RFC] Implement sys_io_test[*]_bit() to return 0 or 1, proposal to deprecate sys_test[*]_bit() #97550
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Correct the documentation of sys_test_bit() and its derivative helper functions (listed below) since these return a bit mask value instead of an essentially boolean value as previosuly described. In tree implementation do conform with that: the result of these functions are always implicitly tested against being 0 or a non-zero value. Helper functions which documentation is modified are sys_test_bit(), sys_test_and_set_bit(), sys_test_and_clear_bit(), sys_bitfield_test_bit(), sys_bitfield_test_and_set_bit() and sys_bitfield_test_and_clear_bit(). Signed-off-by: Etienne Carriere <[email protected]>
Implement sys_io_test_bit(), sus_io_test_and_set_bit() and sys_io_test_and_clear_bit() helper function for IO bit test operation that are expected to return an essentially boolean value. These function are expected to be used instead of sys_test_bit(), sys_test_and_set_bit() and sys_test_and_clear_bit() that return a bit mask result instead of a 0 or 1 result. The functions are not implemented got 32bit X86 and for ARC v2 architectures that already implement then, respectively in include/zephyr/arch/x86/ia32/sys_io.h and include/zephyr/arch/arc/v2/sys_io.h. Signed-off-by: Etienne Carriere <[email protected]>
Change test of sys_test_bit(), sys_bitfield_test_bit() and their derivative helper functions return value since these return a bit mask result, not an essentially boolean value By the way, simplify indentation in the bitfield tests from test/kernel/common. Signed-off-by: Etienne Carriere <[email protected]>
Add tests for sys_io_test_bit(), sys_io_test_and_set_bit() and sys_io_test_and_clear_bit() that are now implemented for all architectures. Add a few inline comments to clarify which bit field helper function are tested as it may be confusing since they have quite alike labels. Signed-off-by: Etienne Carriere <[email protected]>
Change sys_test_bit(), sys_test_and_set_bit() and sys_test_and_clear_bit() documentation to mark them deprecated as one should rather use the sys_io_test()/sys_io_test_and_set_bit()/sys_test_and_clear_bit() variant that return an essentially boolean value and can therefore be used in boolean operations Signed-off-by: Etienne Carriere <[email protected]>
Replace use of deprecated helper functions sys_test_bit(), sys_test_and_set_bit() and sys_test_and_clear_bit() with use of sys_io_test_bit(), sys_io_test_and_set_bit() and sys_io_test_and_clear_bit() that produce essentially boolean values safe to use in boolean operations. Signed-off-by: Etienne Carriere <[email protected]>
Test sys_bitfield_test_bit() return value against 0 (being equal to or different from) since the function returns a bit mask and not an essentially boolean value. Signed-off-by: Etienne Carriere <[email protected]>
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This is an RFC.
The 1st commit of the series already is under review in #97487.
Following #97487, this RFC proposes to implement
sys_io_test_bit(),sys_io_test_and_set_bit()andsys_io_test_and_clear_bit()helper functions that were implemented only on 32bit X86 and ARC V2 architectures. The proposed implementation ensures these function return a essentially boolean value that can be used in boolean operations.I would propose to deprecate the former implementation. Overkilling?
This P-R adds tests for these functions and moves all use of the former helper function to use the
sys_io_test*()variant instead (aside the tests samples that still test the former functions to ensure non-regression of their support).